Products
-
EELS Spectrum Imaging with the K3 Camera (Self-Paced)
BundleLearn to acquire high-quality EELS spectrum images using the K3® camera. Get hands-on training in ZLP alignment, STEM calibration, brightfield centering, and angle measurement in DigitalMicrograph to optimize signal-to-noise and protect samples.
-
EDAX EBSD and OIM Basics (Self-Paced)
BundleLearn the basics of electron backscatter diffraction (EBSD) pattern generation, indexing, and data analysis
-
EELS Basics (Self-Paced)
BundleIn this series, you will learn how to optimize and acquire EELS spectra, align and tune the spectrometer for EELS and EFTEM, plus set up and acquire basic spectrum images, including 4D STEM.
-
STEMx Basics (Self-Paced)
BundleIn this series, you will learn about STEMx 4D STEM, plus how to acquire and analyze 4D datasets for a variety of applications, including strain mapping, virtual imaging, and differential phase contrast.
-
OIM Analysis v9 - Basic Operation (Self-Paced)
CourseLearn to use OIM Analysis v9.1 tools including new map, chart, plot, and texture plot buttons to create and customize maps. Build image quality and IPF maps, adjust partitions and colors, interpret confidence index values, and more.
-
STEMx OIM (Self-Paced)
CourseLearn to use STEMx OIM software for orientation and phase mapping of 4D STEM data. This course provides practical guidance for efficient data analysis and materials characterization.