Products
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OIM Analysis v9.1
CourseDebuts a modern UI, improved workflows, and more powerful QuickGen tools. Navigate seamlessly between basic and advanced pages for faster, smarter materials analysis. Upgrade your workflow with speed and precision.
Free
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ClearView custom gain reference
CourseIn this training you are introduced to the ClearView Custom Gain Reference function. This course is designed for users seeking to optimize image quality under specific imaging conditions.
Free
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Introduction to magnification calibration
CourseProperly calibrated cameras and data are crucial for both imaging and diffraction analyses. This training illustrates how to perform magnification calibration on your camera or data.
Free
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EELS - STEM alignment tool
CourseLearn how to use the STEM alignment tool for precise calibration of convergence and collection angles in EELS acquisition. Master the centering of the brightfield disk within the spectrometer’s entrance aperture for optimal results.
Free
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EDAX EBSD and OIM Basics (Self-Paced)
BundleLearn the basics of electron backscatter diffraction (EBSD) pattern generation, indexing, and data analysis
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STEMx Basics (Self-Paced)
BundleIn this series, you will learn about STEMx 4D STEM, plus how to acquire and analyze 4D datasets for a variety of applications, including strain mapping, virtual imaging, and differential phase contrast.