Products
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DigitalMicrograph v. 3.63: STEMx OIM Features (Self-Paced)
CourseLearn to use STEMx OIM tools in DigitalMicrograph v3.63 to process, visualize, and analyze 4D STEM data, including descan correction, precession alignment, data summation, region extraction, pattern statistics, and dataset reordering.
Free
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DigitalMicrograph v. 3.63: STEMx Features (Self-Paced)
CourseThis course introduces the new STEMx features in DigitalMicrograph v3.63 and the essential workflows used to process, visualize, extract, and manage 4D STEM datasets.
Free
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Custom Scanning (Self-Paced)
CourseExplore custom scanning in spectrum imaging using thresholding masks, sparse scanning, and Python scripting to define user-generated scan patterns.
Free
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Using Resolution Rings (Self-Paced)
CourseThis tutorial illustrates how to add resolution markers to diffraction patterns to use as a helpful guide for analysis.
Free
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In-Situ Data Processing and Visualization (Self-Paced)
CourseMaster exporting processed data in DigitalMicrograph as images, datasets, or MP4s for presentations and publications. Learn drift correction measurement and removal with step-by-step guides, annotated screenshots, and videos to streamline analysis.
Free
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STEMx OIM (Self-Paced)
CourseLearn to use STEMx OIM software for orientation and phase mapping of 4D STEM data. This course provides practical guidance for efficient data analysis and materials characterization.