Products
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EELS - STEM Alignment Tool (Self-Paced)
CourseLearn how to use the STEM alignment tool for precise calibration of convergence and collection angles in EELS acquisition. Master the centering of the brightfield disk within the spectrometer’s entrance aperture for optimal results.
Free
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Introduction to magnification calibration (Self-Paced)
CourseProperly calibrated cameras and data are crucial for both imaging and diffraction analyses. This training illustrates how to perform magnification calibration on your camera or data.
Free
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EELS School Logistics (In-Person, Jülich)
CourseBegin your journey in EELS analysis with the essential tools and logistics for the upcoming in-person school at Jülich.
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EDAX OIM Academy Course Logistics (In-Person)
CourseThis three-day course that includes lectures and computer and microscope time, covering everything from the basics to advanced hands-on operation. This course covers the basics of pattern generation, indexing, and data analysis via OIM Analysis™.
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EDAX EDS Microanalysis Course Logistics (In-Person)
CourseThis course covers basic and practical applications for EDS analysis using our APEX™ Software. The course allows users to gain a fundamental understanding of the basics of EDS, including theory, system and software capabilities, workflow and options.
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SI Acquisition with the K3 Camera (Self-Paced)
CourseLearn to acquire high-quality spectrum images using the K3 direct detection camera with multi-pass spectrum imaging. The course focuses on optimizing EELS acquisition to enhance signal-to-noise ratio while maintaining sample integrity.