EELS Basics (Self-Paced)
In this series, you will learn how to optimize and acquire EELS spectra, align and tune the spectrometer for EELS and EFTEM, plus set up and acquire basic spectrum images, including 4D STEM.
Understanding the EELS fundamentals process and procedures foundation.
The training delves into the crucial aspect of measuring collection angles using DigitalMicrograph, emphasizing their impact on acquired spectra. A three-part course: Scattering angle, dispersion and aperture choice, and detector settings.
This course focuses on acquiring low and high-loss spectra in a DualEELS pair for precise energy-loss measurements, correcting plural scattering, and absolute quantification.
The training covers the effective use of the Gatan Image Filter for acquiring EFTEM images, including ZLP-filtered images, thickness maps, and elemental maps. It also teaches optimization of the filter and microscope for the best image quality.
In this series, you will learn how to optimize and acquire EELS spectra, align and tune the spectrometer for EELS and EFTEM, plus set up and acquire basic spectrum images, including 4D STEM.
Study the fundamental principles at a pace that is most efficient and convenient for you
One-year access ensures you can reference best practices during your materials studies
Interact with industry specialists through the online discussion forum to ask questions and clarify content