EELS Fundamentals (Self-Paced)
Understanding the EELS fundamentals process and procedures foundation.
Part of EELS Basics series
-
Practical Aspects in EELS Mode (Self-Paced)
CourseThe training delves into the crucial aspect of measuring collection angles using DigitalMicrograph, emphasizing their impact on acquired spectra. A three-part course: Scattering angle, dispersion and aperture choice, and detector settings.
-
DualEELS Quantification (Self-Paced)
CourseThis course focuses on acquiring low and high-loss spectra in a DualEELS pair for precise energy-loss measurements, correcting plural scattering, and absolute quantification.
-
EFTEM Imaging (Self-Paced)
CourseThe training covers the effective use of the Gatan Image Filter for acquiring EFTEM images, including ZLP-filtered images, thickness maps, and elemental maps. It also teaches optimization of the filter and microscope for the best image quality.
Instructor
Andrew Thron
Analytical TEM Applications Scientist
[email protected]
Andrew is an Application Scientist at Gatan supporting the analytical product lines. He started his career in Electron Microscopy at APTech, developing new cathodes and electron gun modules for SEMs, TEMs, and plasma generation systems. Andrew Earned his Ph. D. from the University of California, Davis, working under Dr. Klaus van Benthem. After graduating, he pursued a Post-Doctoral appointment at the Molecular Foundry before returning to UC Davis. Prior to starting at Gatan, Andrew served as the Technical Director of AMCaT, the Materials Characterization Facility at UC Davis. Andrew has over 16 years of experience applying TEM, aberration-corrected STEM, EELS, EDS, FIB, and SEM to a broad range of materials.