STEM EELS and Spectrum Imaging (Self-Paced)
This course provides hands-on training in the essential procedures for aligning and focusing on spectrometer using the zero-loss peak (ZLP).
Part of bundle
-
Aligning the Spectrometer (Self-Paced)
CourseAn introduction to aligning and focusing the spectrometer using the zero-loss peak before beginning spectral acquisition.
-
STEM EELS and Spectrum Imaging (Self-Paced)
CourseThis course provides hands-on training in the essential procedures for aligning and focusing on spectrometer using the zero-loss peak (ZLP).
-
Practical Aspects in EELS Mode (Self-Paced)
CourseThe training delves into the crucial aspect of measuring collection angles using DigitalMicrograph, emphasizing their impact on acquired spectra. A three-part course: Scattering angle, dispersion and aperture choice, and detector settings.
-
EELS - STEM Alignment Tool (Self-Paced)
CourseLearn how to use the STEM alignment tool for precise calibration of convergence and collection angles in EELS acquisition. Master the centering of the brightfield disk within the spectrometer’s entrance aperture for optimal results.
-
SI Acquisition with the K3 Camera (Self-Paced)
CourseLearn to acquire high-quality spectrum images using the K3 direct detection camera with multi-pass spectrum imaging. The course focuses on optimizing EELS acquisition to enhance signal-to-noise ratio while maintaining sample integrity.
Instructor
Andrew Thron
Analytical TEM Applications Scientist
[email protected]
Andrew is an Application Scientist at Gatan supporting the analytical product lines. He started his career in Electron Microscopy at APTech, developing new cathodes and electron gun modules for SEMs, TEMs, and plasma generation systems. Andrew Earned his Ph. D. from the University of California, Davis, working under Dr. Klaus van Benthem. After graduating, he pursued a Post-Doctoral appointment at the Molecular Foundry before returning to UC Davis. Prior to starting at Gatan, Andrew served as the Technical Director of AMCaT, the Materials Characterization Facility at UC Davis. Andrew has over 16 years of experience applying TEM, aberration-corrected STEM, EELS, EDS, FIB, and SEM to a broad range of materials.