EELS & EFTEM Analysis (Online)
Explore the fundamental principles and in-depth electron energy loss spectroscopy methods to characterize your materials
As a course attendee, you will learn best practices to set up and optimize your electron energy-loss spectroscopy (EELS) studies so you can capture and extract the maximum amount of compositional and chemical information from your samples
Interact with industry specialists during live-remote microscope sessions on May 21 - 23, 2024 (two-hour session hosted each day at 8 a.m. PDT, then repeated at 4 p.m. PDT)
Study the fundamental principles at a pace that is most efficient and convenient for you until May 31, 2025
Immerse yourself in discussions with fellow researchers to enhance performance and grow your collaborative network
Gain the advanced training necessary to thoroughly understand the EELS and EFTEM techniques
Attain a professional certificate upon course completion
Download the essentials
Session Recording: Basics of EELS and Spectrum Imaging_Morning
Session Recording: Basics of EELS and Spectrum Imaging_Afternoon
Session Recording: EFTEM; 4D STEM; more with STEM EELS_Morning
Session Recording: EFTEM; 4D STEM; more with STEM EELS_Afternoon
Session Recording: Advanced STEM EELS; Student Topics_Morning
Session Recording: Advanced STEM EELS; Student Topics_Afternoon
Lesson 1: Introduction
Lesson 2: EELS fundamentals
Lesson 3: EFTEM fundamentals
Lesson 4: Spectrum imaging fundamentals
Lesson 5: Data acquisition - Hardware and software overview
Lesson 6: Data acquisition - Camera setup and filter tuning
Lesson 7: Data analysis - DigitalMicrograph basics
Lesson 8: Data analysis - Basics of image windows
Lesson 9: Data acquisition - EFTEM basics
Lesson 10: Data analysis - Using raster image displays
Lesson 11: Data analysis - Basics of EFTEM images
Lesson 12: Data acquisition - EELS basics
Lesson 13: Data analysis - Using lineplot displays
Lesson 14: Data analysis - Basic of EELS spectra
Lesson 15: Data analysis - STEM spectrum imaging example
Lesson 1: Specimen information from EELS
Lesson 2: EELS - Zero-loss and low-loss
Lesson 3: EELS core-loss, ELNES, and EXELFS
Lesson 4: EELS practical aspects
Lesson 5: Data acquisition - EELS practical aspects - Scattering angle
Lesson 6: Data acquisition - EELS practical aspects - Dispersion
Lesson 7: Data acquisition - EELS practical aspects - GIF entrance aperture
Lesson 8: Data acquisition - EELS practical aspects - Detector parameters
Lesson 9: EELS quantification - Introduction
Lesson 10: EELS quantification - Choosing edges for analysis
Lesson 11: Data analysis - Basic analysis of EELS spectra
Lesson 12: EELS quantification - Window placement
Lesson 13: Data acquisition - Single EELS quantification
Lesson 14: Data analysis - Quantification of EELS spectra
Lesson 15: EELS quantification - Plural scattering
Lesson 16: EELS quantification - Convert edge intensities to chemical concentrations
Lesson 17: DualEELS
Lesson 18: Data acquisition - DualEELS
Lesson 19: Data analysis - DualEELS
Lesson 20: EELS quantification - Standards
Lesson 21: Data analysis - EELS quantification with standards
Lesson 22: High-resolution EELS
Lesson 23: Angular-resolved EELS
Lesson 1: EFTEM introduction
Lesson 2: EFTEM - Filter optimization
Lesson 3: Data acquisition - Filter optimization
Lesson 4: EFTEM applications - Contrast enhancement
Lesson 5: Data acquisition - EFTEM applications - Contrast enhancement
Lesson 6: EFTEM applications - Mapping
Lesson 7: Data acquisition - EFTEM applications - Mapping
Lesson 8: Data analysis - Quantification using EFTEM images
Lesson 9: Data analysis - Combining and colorizing maps
Lesson 10: EFTEM applications - Chemical analysis
Lesson 11: EFTEM practical aspects
Lesson 12: Data acquisition - EFTEM practical aspects
Lesson 13: Data Analysis - Advanced EFTEM analysis
Lesson 14: EFTEM-SI practical aspects
Lesson 15: Data acquisition - EFTEM SI
Lesson 16: Data analysis - EFTEM-SI data processing
Lesson 1: Diffraction theory and fundamentals
Lesson 2: Data acquisition - Practical SAD and energy filtering
Lesson 3: STEM fundamentals (brief introduction, detector geometry, descan)
Lesson 4: Data acquisition - STEM setup for 4D STEM
Lesson 5: 4D STEM Diffraction
Lesson 6: Data acquisition - 4D STEM
Lesson 7: Data analysis - 4D STEM Utilities
Lesson 1: STEM EELS introduction
Lesson 2: Data acquisition - STEM alignment tool
Lesson 3: Data acquisition - STEM set up and elemental mapping
Lesson 4: Data acquisition - Chemical analysis
Lesson 5: STEM EELS SI - Correcting for artifacts and instabilities
Lesson 6: Data acquisition - Using drift correction
Lesson 7: STEM EELS SI - Specimen sampling and dose control
Lesson 8: Data acquisition - Sub-pixel scanning and multiple pass
Lesson 9: Data acquisition - Line profile and average dose line profile
Lesson 10: Data analysis - Linescan processing example
Lesson 11: Data acquisition - DualEELS
Lesson 12: Data analysis - ZLP fitting to a low-loss spectrum image
Lesson 13: Data analysis - Removal of plural scattering from spectrum images
Lesson 14: Data analysis - DualEELS quantitative mapping
Lesson 15: Advanced SI
Lesson 16: Data acquisition - Multimodal spectrum imaging
Lesson 17: Data analysis - Multisignal data and STEM SI
Lesson 18: Data acquisition - MultiPoint and time series
Lesson 19: Data analysis - Mapping with internal standards
Lesson 20: Data analysis - Mapping with external standards