Instructor(s)

Liam Spillane

Analytical Application Scientist

Liam has been working in the field of electron microscopy for the past 15 years. He started his career as a Ph.D. student at Imperial College London studying oxide thin films using aberration-corrected (S)TEM and monochromated EELS. After completing his Ph.D., he worked as a post-doctoral research assistant in advanced EM, working on the structural and chemical characterization of materials across a number of projects, including nanoparticle toxicology, ferroelectrics, nanoparticle catalysts, and solid oxide fuel cells. In 2012, Dr. Spillane joined Gatan, initially working with the UK sales & service group for several years. He relocated to Gatan Headquarters in Pleasanton, CA, in 2018, where he is currently the application scientist for Gatan’s EELS, EFTEM, and STEM products.

Ray Twesten

Product Manager - Analytical Instruments

Ray has been working in the field of electron microscopy for the past 25 years. He started his career as a Ph.D. student at the University of Illinois at Urbana-Champaign, studying surface physics using a specially designed UHV TEM. He moved to Sandia National Labs in Albuquerque, NM working to understand morphological instabilities in III-V and group-IV semiconductors. Ray rejoined the University of Illinois in 1997 as a staff scientist and laboratory manager for the TEM operations of the Center for Microanalysis of Materials. Since 2005, Dr. Twesten has been with Gatan in Pleasanton, CA, first with the EELS R&D group and later as the EELS product development group manager. Currently, he is the product manager for Gatan’s EELS, EFTEM, and STEM products.

Andrew Thron

Analytical TEM Applications Scientist

Andrew is an Application Scientist at Gatan supporting the analytical product lines. He started his career in Electron Microscopy at APTech, developing new cathodes and electron gun modules for SEMs, TEMs, and plasma generation systems. Andrew Earned his Ph. D. from the University of California, Davis, working under Dr. Klaus van Benthem. After graduating, he pursued a Post-Doctoral appointment at the Molecular Foundry before returning to UC Davis. Prior to starting at Gatan, Andrew served as the Technical Director of AMCaT, the Materials Characterization Facility at UC Davis. Andrew has over 16 years of experience applying TEM, aberration-corrected STEM, EELS, EDS, FIB, and SEM to a broad range of materials.

Power of EELS

As a course attendee, you will learn best practices to set up and optimize your electron energy-loss spectroscopy (EELS) studies so you can capture and extract the maximum amount of compositional and chemical information from your samples

  • Study the fundamental principles at a pace that is most efficient and convenient for you until August 31, 2023

  • Interact with industry specialists during live-remote microscope sessions on April 18 - 20, 2023 (two-hour session hosted each day at 8 a.m. PDT, then repeated at 4 p.m. PDT)

  • Immerse yourself in discussions with fellow researchers to enhance performance and grow your collaborative network

  • Gain the advanced training necessary to thoroughly understand the EELS and EFTEM techniques

  • Attain a professional certificate upon course completion

Course curriculum

    1. Download the essentials

    2. Save the dates

    3. LIVE Session on Tuesday, April 18: Basics of EELS and Spectrum Imaging

    4. LIVE Session on Wednesday, April 19: EFTEM; 4D STEM; more with STEM EELS

    5. LIVE Session on Thursday, April 20: Advanced STEM EELS; Student Topics

    1. Lesson 1: Introduction

    2. Lesson 2: EELS fundamentals

    3. Lesson 3: EFTEM fundamentals

    4. Lesson 4: Spectrum imaging fundamentals

    5. Lesson 5: Data acquisition - Hardware and software overview

    6. Lesson 6: Data acquisition - Camera setup and filter tuning

    7. Lesson 7: Data analysis - DigitalMicrograph basics

    8. Lesson 8: Data analysis - Basics of image windows

    9. Lesson 9: Data acquisition - EFTEM basics

    10. Lesson 10: Data analysis - Using raster image displays

    11. Lesson 11: Data analysis - Basics of EFTEM images

    12. Lesson 12: Data acquisition - EELS basics

    13. Lesson 13: Data analysis - Using lineplot displays

    14. Lesson 14: Data analysis - Basic of EELS spectra

    15. Lesson 15: Data analysis - STEM spectrum imaging example

    1. Lesson 1: Specimen information from EELS

    2. Lesson 2: EELS - Zero-loss and low-loss

    3. Lesson 3: EELS core-loss, ELNES, and EXELFS

    4. Lesson 4: EELS practical aspects

    5. Lesson 5: Data acquisition - EELS practical aspects - Scattering angle

    6. Lesson 6: Data acquisition - EELS practical aspects - Dispersion

    7. Lesson 7: Data acquisition - EELS practical aspects - GIF entrance aperture

    8. Lesson 8: Data acquisition - EELS practical aspects - Detector parameters

    9. Lesson 9: EELS quantification - Introduction

    10. Lesson 10: EELS quantification - Choosing edges for analysis

    11. Lesson 11: Data analysis - Basic analysis of EELS spectra

    12. Lesson 12: EELS quantification - Window placement

    13. Lesson 13: Data acquisition - Single EELS quantification

    14. Lesson 14: Data analysis - Quantification of EELS spectra

    15. Lesson 15: EELS quantification - Plural scattering

    16. Lesson 16: EELS quantification - Convert edge intensities to chemical concentrations

    17. Lesson 17: DualEELS

    18. Lesson 18: Data acquisition - DualEELS

    19. Lesson 19: Data analysis - DualEELS

    20. Lesson 20: EELS quantification - Standards

    21. Lesson 21: Data analysis - EELS quantification with standards

    22. Lesson 22: High-resolution EELS

    23. Lesson 23: Angular-resolved EELS

    1. Lesson 1: EFTEM introduction

    2. Lesson 2: EFTEM - Filter optimization

    3. Lesson 3: Data acquisition - Filter optimization

    4. Lesson 4: EFTEM applications - Contrast enhancement

    5. Lesson 5: Data acquisition - EFTEM applications - Contrast enhancement

    6. Lesson 6: EFTEM applications - Mapping

    7. Lesson 7: Data acquisition - EFTEM applications - Mapping

    8. Lesson 8: Data analysis - Quantification using EFTEM images

    9. Lesson 9: Data analysis - Combining and colorizing maps

    10. Lesson 10: EFTEM applications - Chemical analysis

    11. Lesson 11: EFTEM practical aspects

    12. Lesson 12: Data acquisition - EFTEM practical aspects

    13. Lesson 13: Data Analysis - Advanced EFTEM analysis

    14. Lesson 14: EFTEM-SI practical aspects

    15. Lesson 15: Data acquisition - EFTEM SI

    16. Lesson 16: Data analysis - EFTEM-SI data processing

    1. Lesson 1: Diffraction theory and fundamentals

    2. Lesson 2: Data acquisition - Practical SAD and energy filtering

    3. Lesson 3: STEM fundamentals (brief introduction, detector geometry, descan)

    4. Lesson 4: Data acquisition - STEM setup for 4D STEM

    5. Lesson 5: 4D STEM Diffraction

    6. Lesson 6: Data acquisition - 4D STEM

    7. Lesson 7: Data analysis - 4D STEM Utilities

    1. Lesson 1: STEM EELS introduction

    2. Lesson 2: Data acquisition - STEM alignment tool

    3. Lesson 3: Data acquisition - STEM set up and elemental mapping

    4. Lesson 4: Data acquisition - Chemical analysis

    5. Lesson 5: STEM EELS SI - Correcting for artifacts and instabilities

    6. Lesson 6: Data acquisition - Using drift correction

    7. Lesson 7: STEM EELS SI - Specimen sampling and dose control

    8. Lesson 8: Data acquisition - Sub-pixel scanning and multiple pass

    9. Lesson 9: Data acquisition - Line profile and average dose line profile

    10. Lesson 10: Data analysis - Linescan processing example

    11. Lesson 11: Data acquisition - DualEELS

    12. Lesson 12: Data analysis - ZLP fitting to a low-loss spectrum image

    13. Lesson 13: Data analysis - Removal of plural scattering from spectrum images

    14. Lesson 14: Data analysis - DualEELS quantitative mapping

    15. Lesson 15: Advanced SI

    16. Lesson 16: Data acquisition - Multimodal spectrum imaging

    17. Lesson 17: Data analysis - Multisignal data and STEM SI

    18. Lesson 18: Data acquisition - MultiPoint and time series

    19. Lesson 19: Data analysis - Mapping with internal standards

    20. Lesson 20: Data analysis - Mapping with external standards

About this course

  • 112 lessons
  • 19.5 hours of video content