Key topics

  • Align precession data

  • Sum to real or diffraction space

  • Extract spatial or diffraction region

  • Pixel-wise max./min.

  • Reorder for fast spatial access

  • Descan correction

Instructor(s)

Fernando Castro

Application Scientist Ph.D.

Fernando is an Application Scientist at Gatan in charge of supporting imaging and diffraction products. He joined Gatan in 2019 after completing his Ph.D. in Materials Science and Engineering from Northwestern University. Fernando has over 10 years of experience in electron microscopy through his research experience on nanomaterials and lithium ion battery materials, and is well versed in many of the key EM techniques for analyzing materials science samples.