EM ACADEMY
Gain real-world experience to elevate your electron microscopy research
In this training you are introduced to the ClearView Custom Gain Reference function. This course is designed for users seeking to optimize image quality under specific imaging conditions.
Free
Properly calibrated cameras and data are crucial for both imaging and diffraction analyses. This training illustrates how to perform magnification calibration on your camera or data.
Free
Learn how to use the STEM alignment tool for precise calibration of convergence and collection angles in EELS acquisition. Master the centering of the brightfield disk within the spectrometer’s entrance aperture for optimal results.
Free
Stream lessons from application specialists and design engineers anytime, anywhere, and at your own pace.
Gain the theoretical and pragmatic knowledge to utilize emerging electron microscopy techniques.
Benefit from a deeply engaging learning experience with practical applications and feedback from professional instructors to advance your research and earn a career credential.